Reflectron time-of-flight mass spectrometer (RETOFMS) combined with vacuum chamber

  • Detected mass range: 1-5000 u (positive ions) and 1-3000 u (negative ions)
  • Mass resolution: > 800 (measured with the background gas using the provided on-board electron impact ionizer)
  • Possibility of detection: analysis of abundance and velocity distributions of particles in gas and plasma flows, positive ions, negative ions, neutrals
  • Registration time resolution: A time-to-digital converter with time resolution of 0.25 ns
  • Detectors: dual microchannel plate ion detector (positive and negative ions) and high-voltage discrete-dynode detector (positive ions)
  • Detection sensitivity: Ion counting system allowing to detect single ions
  • Environment:
    • high vacuum
    • ambient gases: He, O2, N2, Ar
  • Vacuum system:
    • ablation vacuum chamber: below 6e-5 mbar, inner dimensions: 500 mm diameter, 600 mm height.
    • RETOFMS vacuum chamber with a differential pumping system:
      • Under high vacuum conditions (2e-7 mbar)
      • Under ambient gas conditions: RETOFMS chamber (below 2e-6 mbar) when the ambient gas pressure in the plasma chamber is 0.7 mbar
    • Laser systems for ablation:
      • Pharos (Light Conversion – 1030 nm, 532 nm, 343 nm, 257 nm; 250 fs – 10 ps; 1 Hz – 200 kHz)
      • NL230 (EXPLA – 1064 nm, 532 nm, 355 nm; 3-6 ns; 100 Hz)
    • Target positioning: XYZ stages (100 x 100 x 25 mm3)

Prof. Alexander V. Bulgakov, Dr. Sc.

Team Leader: Nanomaterials | + 420 314 007 733 | alexander.bulgakov(at)hilase.cz

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