Raman Spectrometer
- Three excitation laser wavelengths: 532 nm, 638 nm, 785 nm
- Four gratings 600 gr, 1200 gr, 1800 gr, 2400 gr
- Spectral resolution <1.4 cm -1
- Upright confocal microscope
- SWIFT mode scanning for fast mapping
- Lateral resolution: 500 nm
- TERS resolution: 15 nm
Atomic Force Microscope
- STM, Conductive AFM. ranges 1 nA, 100 nA, 10 uA
- Scanning range 100 um x100 um x 15 um
- Vertical resolution: <1nm
- Horizontal resolution: tip curvature dependant
- Contact mode, Semi contact mode, non contact mode
- Phase imaging, lateral force microscopy and force modulation
- Kelvin Probe (surface potential microscopy)
Atomic force Microscopy combined with Raman
- Direct Raman access from side and top allowing simultaneous Raman and AFM Measurements
- The combination of AFM and Raman allows Tip Enhanced Raman Spectroscopy creating up to 15 nm resolution Raman.
Ing. Jan Hrabovsky
Ph.D. Student: Pulsed Laser Deposition; jan.hrabovsky(at)hilase.cz
